New MRI-safe Implant Electrode Design

McCabe, Steven Owen; Scott, Jonathan B.

doi:10.1109/MWSYM.2016.7540205

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McCabeScott_IMS2016.pdf

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DOI

10.1109/MWSYM.2016.7540205

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McCabe, S. O., & Scott, J. B. (2016). New MRI-safe Implant Electrode Design. In 2016 IEEE MTT-S International Microwave Symposium (IMS). San Francisco, CA: IEEE. https://doi.org/10.1109/MWSYM.2016.7540205

Permanent Research Commons link: https://hdl.handle.net/10289/10881

Abstract

Medical implants often prevent patients having Magnetic Resonance Imaging (MRI) scans because the leads behave as antennas with respect to the RF excitation and cause hazardous heating in neural tissue. This manuscript describes an approach that virtually eliminates the risk of RF heating by means of easily-incorporated, mutually-coupled filars. The resulting leads need be neither physically larger nor significantly more costly than existing designs. Combined with thin insulation and surface roughening techniques, this manuscript represents the first complete release of recently-patented technologies. Both simulations and measurements at 128MHz are presented to confirm performance in 3-Tesla MRI machines.

Date

2016-01-01

Type

Conference Contribution

Publisher

IEEE

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This is an author’s accepted version of an article published in the proceedings of 2016 IEEE MTT-S International Microwave Symposium (IMS). © 2016 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

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