All for one and one for all: reconciling research and production values at the HathiTrust through user-scripting
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Accepted version, 293.4Kb
Citation
Export citationBainbridge, D., & Downie, J. S. (2017). All for one and one for all: reconciling research and production values at the HathiTrust through user-scripting. In Proceedings of 2017 ACM/IEEE Joint Conference on Digital Libraries (pp. 283–284). Toronto, Canada: IEEE. https://doi.org/10.1109/JCDL.2017.7991591
Permanent Research Commons link: https://hdl.handle.net/10289/11278
Abstract
This article details a practical technique that safely reconciles the production stability and integrity of the HathiTrust Digital Library (HTDL) with the riskier and potentially disruptive experimental functionalities created by the HathiTrust Research Center. Web systems produced by HTRC are necessarily more speculative and, understandably, operate on equipment outside of the HTDL production environment. The key to our approach that brings these two parts closer together is to exploit user-scripting: a web browser add-in technique that allows users to introduce bespoke Javascript code that alters the behavior of specific website(s). We demonstrate how it can be used to provide a mashup of three web sites: HTDL and two web-based offerings operated independently by HTRC. The end result is that the user interacts with the HTDL as usual, and at strategic locations in the interface additionally functionality drawn from the research systems-which takes account of the user's current context-is seamlessly blended in.
Date
2017Publisher
IEEE
Rights
This is an author’s accepted version of an article published in the Proceedings of 2017 ACM/IEEE Joint Conference on Digital Libraries. © 2017 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.