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      A computerized Langmuir probe system

      Pilling, L.S.; Bydder, E.L.; Carnegie, Dale A.
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      Rev. probe system.pdf
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      DOI
       10.1063/1.1581362
      Link
       link.aip.org
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      Citation
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      Pilling, L.S., Bydder, E.L. & Carnegie, D.A. (2003). A computerized Langmuir probe system. Review of Scientific Instruments, 74, 3341.
      Permanent Research Commons link: https://hdl.handle.net/10289/1256
      Abstract
      For low pressure plasmas it is important to record entire single or double Langmuir probe characteristics accurately. For plasmas with a depleted high energy tail, the accuracy of the recorded ion current plays a critical role in determining the electron temperature. Even for high density Maxwellian distributions, it is necessary to accurately model the ion current to obtain the correct electron density. Since the electron and ion current saturation values are, at best, orders of magnitude apart, a single current sensing resistor cannot provide the required resolution to accurately record these values. We present an automated, personal computer based data acquisition system for the determination of fundamental plasma properties in low pressure plasmas. The system is designed for single and double Langmuir probes, whose characteristics can be recorded over a bias voltage range of ±70 V with 12 bit resolution. The current flowing through the probes can be recorded within the range of 5 nA–100 mA. The use of a transimpedance amplifier for current sensing eliminates the requirement for traditional current sensing resistors and hence the need to correct the raw data. The large current recording range is realized through the use of a real time gain switching system in the negative feedback loop of the transimpedance amplifier.
      Date
      2003-07
      Type
      Journal Article
      Publisher
      American Institute of Physics
      Rights
      Copyright 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in the Review of Scientific Instruments and may be found at http://jmp.aip.org/jmp/top.jsp
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