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      Jitter measurement in digital signals by using software defined radio technology

      Anthonys, Gehan; Cree, Michael J.; Streeter, Lee
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      DOI
       10.1109/I2MTC.2019.8826908
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      Anthonys, G., Cree, M. J., & Streeter, L. (2019). Jitter measurement in digital signals by using software defined radio technology (pp. 1–5). Presented at the 2019 IEEE International Instrumentation & Measurement Technology Conference, Washington, DC, USA: IEEE. https://doi.org/10.1109/I2MTC.2019.8826908
      Permanent Research Commons link: https://hdl.handle.net/10289/13014
      Abstract
      Here, we propose a method using software defined radio (SDR) technology to measure periodic and random jitter in a digital signal. Conventional methods to measure jitter required expensive measurement equipment. We use a cheap (less than US $40) SDR USB dongle to expose random and periodic jitter in the amplitude modulated light source of a range camera. By using Fourier analysis we generate an ideal reference signal to enable to extract jitter at the zero crossings of the signal under test. We measure jitter with SDR receiver and more conventionally a real-time digital oscilloscope. From the SDR receiver, we find the periodic jitter at low frequency and compare to the oscilloscope results. We demonstrate that periodic and random jitter can be detected on a RF signal with consumer priced products provided that the jitter frequency less within the bandwidth of the receiver.
      Date
      2019
      Type
      Conference Contribution
      Publisher
      IEEE
      Rights
      This is an author’s accepted version of an article published in the Proceedings of 2019 IEEE International Instrumentation & Measurement Technology Conference. © 2019 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
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