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dc.contributor.authorLegeard, Bruno
dc.contributor.authorPeureux, Fabien
dc.contributor.authorUtting, Mark
dc.coverage.spatialConference held at Grenoble, Franceen_NZ
dc.date.accessioned2008-11-20T00:12:23Z
dc.date.available2008-11-20T00:12:23Z
dc.date.issued2002
dc.identifier.citationLegeard, B. Peureux, F. & Utting, M.(2002). A Comparison of the BTT and TTF Test-Generation Methods. In D. Bert et al. (Eds.), Proceedings of 2nd International Conference of B and Z Users Grenoble, France, January 23–25, 2002 (pp. 115-122). Berlin: Springer.en_US
dc.identifier.isbn978-3-540-43166-4
dc.identifier.urihttps://hdl.handle.net/10289/1409
dc.description.abstractThis paper compares two methods of generating tests from formal specifications. The Test Template Framework (TTF) method is a framework and set of heuristics for manually generating test sets from a Z specification. The B Testing Tools (BTT) method uses constraint logic programming techniques to generate test sequences from a B specification. We give a concise description of each method, then compare them on an industrial case study, which is a subset of the GSM 11.11 smart card specification.en_US
dc.language.isoen
dc.publisherSpringeren_US
dc.relation.urihttp://www.springerlink.com/content/2nwp7gq2byg9mmwn/
dc.subjectcomputer scienceen_US
dc.subjectTest Template Frameworken_US
dc.titleA Comparison of the BTT and TTF Test-Generation Methodsen_US
dc.typeConference Contributionen_US
dc.relation.isPartOf2nd International Conference of B and Z Usersen_NZ
pubs.begin-page309en_NZ
pubs.elements-id13691
pubs.end-page329en_NZ
pubs.finish-date2002-01-25en_NZ
pubs.place-of-publicationBerlinen_NZ
pubs.start-date2002-01-23en_NZ
pubs.volumeZB 2002: Formal Specification and Development in Z and B LNCS 2272en_NZ


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