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      Toward-1mm depth precision with a solid state full-field range imaging system

      Dorrington, Adrian A.; Carnegie, Dale A.; Cree, Michael J.
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      Towards 1-mm depth precision.pdf
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      DOI
       10.1117/12.641980
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      Adrian A. Dorrington, Dale A. Carnegie and Michael J. Cree, "Toward-1mm depth precision with a solid state full-field range imaging system," Sensors, Cameras, and Systems for Scientific/Industrial Applications VII, Morley M. Blouke, Editor, Proc. SPIE, 6068, 60680K, (2006).
      Permanent Research Commons link: https://hdl.handle.net/10289/3818
      Abstract
      Previously, we demonstrated a novel heterodyne based solid-state full-field range-finding imaging system. This system is comprised of modulated LED illumination, a modulated image intensifier, and a digital video camera. A 10 MHz drive is provided with 1 Hz difference between the LEDs and image intensifier. A sequence of images of the resulting beating intensifier output are captured and processed to determine phase and hence distance to the object for each pixel. In a previous publication, we detailed results showing a one-sigma precision of 15 mm to 30 mm (depending on signal strength). Furthermore, we identified the limitations of the system and potential improvements that were expected to result in a range precision in the order of 1 mm. These primarily include increasing the operating frequency and improving optical coupling and sensitivity. In this paper, we report on the implementation of these improvements and the new system characteristics. We also comment on the factors that are important for high precision image ranging and present configuration strategies for best performance. Ranging with sub-millimeter precision is demonstrated by imaging a planar surface and calculating the deviations from a planar fit. The results are also illustrated graphically by imaging a garden gnome.
      Date
      2006
      Type
      Conference Contribution
      Publisher
      SPIE and IS&T
      Rights
      Copyright 2006 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
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