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dc.contributor.authorKularatna, Nihal
dc.contributor.authorFernando, Jayathu
dc.contributor.authorPandey, Amit
dc.contributor.authorJames, Sisira
dc.date.accessioned2013-03-06T20:31:50Z
dc.date.available2013-03-06T20:31:50Z
dc.date.copyright2011-10
dc.date.issued2011
dc.identifier.citationKularatna, N., Fernando, J., Pandey, A., & James, S. (2011). Surge Capability Testing of Supercapacitor Families Using a Lightning Surge Simulator. IEEE Transactions on Industrial Electronics, 58(10), 4942-4949.en_NZ
dc.identifier.issn0278-0046
dc.identifier.urihttps://hdl.handle.net/10289/7316
dc.description.abstractSupercapacitors (SCs) are capable of storing energy in the range of fractional joules to several thousands of joules despite their lower dc voltage ratings. Farad-order capacitances combined with milliohm-order equivalent series resistances provide time constants ranging from fractional seconds to seconds. Given these time constants, compared to the time durations of power line transients in the range of a few microseconds to several hundreds of microseconds, these devices may be able to withstand short-duration surges with energy values specified in IEEE C62-XX series, IEC 61400-4-5, and similar standards. However, there is little or no manufacturer datasheet information on these aspects. This paper provides details of an automatic tester interfaced with a lightning surge simulator, a test procedure, and summarized test data on three different families of SCs. The test data set provides some valuable insight in estimating the capabilities of these new SC families to withstand surges and transients, which, in turn, could lead to nontraditional applications.en_NZ
dc.language.isoen
dc.publisherIEEEen_NZ
dc.relation.ispartofIEEE Transactions on Industrial Electronics
dc.subjectEquivalent circuitsen_NZ
dc.subjectcapacitorsen_NZ
dc.subjectSurge protectionen_NZ
dc.subjectSurgesen_NZ
dc.subjectTestingen_NZ
dc.subjectTransient analysisen_NZ
dc.titleSurge capability testing of supercapacitor families using a lightning surge simulatoren_NZ
dc.typeJournal Articleen_NZ
dc.identifier.doi10.1109/TIE.2011.2109338en_NZ
dc.relation.isPartOfIEEE Transactions on Industrial Electronicsen_NZ
pubs.begin-page4942en_NZ
pubs.elements-id36984
pubs.end-page4949en_NZ
pubs.issue10en_NZ
pubs.volume58en_NZ


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