New MRI-safe Implant Electrode Design

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dc.contributor.authorMcCabe, Steven Owenen_NZ
dc.contributor.authorScott, Jonathan B.en_NZ
dc.coverage.spatialSan Francisco, CAen_NZ
dc.date.accessioned2017-02-10T00:58:11Z
dc.date.available2016-01-01en_NZ
dc.date.available2017-02-10T00:58:11Z
dc.date.issued2016-01-01en_NZ
dc.description.abstractMedical implants often prevent patients having Magnetic Resonance Imaging (MRI) scans because the leads behave as antennas with respect to the RF excitation and cause hazardous heating in neural tissue. This manuscript describes an approach that virtually eliminates the risk of RF heating by means of easily-incorporated, mutually-coupled filars. The resulting leads need be neither physically larger nor significantly more costly than existing designs. Combined with thin insulation and surface roughening techniques, this manuscript represents the first complete release of recently-patented technologies. Both simulations and measurements at 128MHz are presented to confirm performance in 3-Tesla MRI machines.
dc.format.mimetypeapplication/pdf
dc.identifier.citationMcCabe, S. O., & Scott, J. B. (2016). New MRI-safe Implant Electrode Design. In 2016 IEEE MTT-S International Microwave Symposium (IMS). San Francisco, CA: IEEE. https://doi.org/10.1109/MWSYM.2016.7540205en
dc.identifier.doi10.1109/MWSYM.2016.7540205
dc.identifier.issn0149-645Xen_NZ
dc.identifier.urihttps://hdl.handle.net/10289/10881
dc.language.isoen
dc.publisherIEEEen_NZ
dc.relation.isPartOf2016 IEEE MTT-S International Microwave Symposium (IMS)en_NZ
dc.rightsThis is an author’s accepted version of an article published in the proceedings of 2016 IEEE MTT-S International Microwave Symposium (IMS). © 2016 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
dc.sourceIEEE MTT-S International Microwave Symposium (IMS)en_NZ
dc.subjectScience & Technologyen_NZ
dc.subjectTechnologyen_NZ
dc.subjectPhysical Sciencesen_NZ
dc.subjectEngineering, Electrical & Electronicen_NZ
dc.subjectPhysics, Applieden_NZ
dc.subjectEngineeringen_NZ
dc.subjectPhysicsen_NZ
dc.subjectElectrodes
dc.subjectLead
dc.subjectImplants
dc.subjectHeating
dc.subjectMagnetic resonance imaging
dc.subjectConductors
dc.subjectTemperature measurement
dc.titleNew MRI-safe Implant Electrode Designen_NZ
dc.typeConference Contribution
pubs.elements-id142208
pubs.finish-date2016-05-27en_NZ
pubs.organisational-group/Waikato
pubs.organisational-group/Waikato/FSEN
pubs.organisational-group/Waikato/FSEN/2018 PBRF - FSEN
pubs.organisational-group/Waikato/FSEN/Engineering
pubs.publication-statusPublisheden_NZ
pubs.start-date2016-05-22en_NZ
uow.verification.statusverified
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