Cause of pulse artefacts inherent to the electrodes of neuromodulation implants

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dc.contributor.authorSingle, Peteren_NZ
dc.contributor.authorScott, Jonathan B.en_NZ
dc.date.accessioned2018-10-17T03:14:14Z
dc.date.available2018en_NZ
dc.date.available2018-10-17T03:14:14Z
dc.date.issued2018en_NZ
dc.description.abstractThe current pulses delivered through platinum electrodes by medical implants to recruit neurones give rise to slowly-decaying voltage tails, called "artefacts''. These tails make measurement of evoked potentials following the pulses very difficult. We present evidence to show that in a typical clinical scenario these tails are mostly caused by concentration gradients of species induced in the electrical double layer adsorbed onto the surface of both stimulating and passive electrodes. A compact model is presented that allows simulation of these artefacts. The model is verified against measurements made in saline. This shows that electrode artefacts are an intrinsic property of the conductive electrodes of a lead.en_NZ
dc.format.mimetypeapplication/pdf
dc.identifier.citationSingle, P., & Scott, J. B. (2018). Cause of pulse artefacts inherent to the electrodes of neuromodulation implants. IEEE Transactions on Neural Systems and Rehabilitation Engineering, 26(10). https://doi.org/10.1109/TNSRE.2018.2870169en
dc.identifier.doi10.1109/TNSRE.2018.2870169en_NZ
dc.identifier.issn1534-4320en_NZ
dc.identifier.urihttps://hdl.handle.net/10289/12121
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineersen_NZ
dc.relation.isPartOfIEEE Transactions on Neural Systems and Rehabilitation Engineeringen_NZ
dc.rightsThis is an author’s accepted version of an article published in the journal: IEEE Transactions on Neural Systems and Rehabilitation Engineering. © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.titleCause of pulse artefacts inherent to the electrodes of neuromodulation implantsen_NZ
dc.typeJournal Article
pubs.elements-id226809
pubs.issue10en_NZ
pubs.organisational-group/Waikato
pubs.organisational-group/Waikato/2018 PBRF
pubs.organisational-group/Waikato/FSEN
pubs.organisational-group/Waikato/FSEN/2018 PBRF - FSEN
pubs.organisational-group/Waikato/FSEN/School of Engineering
pubs.organisational-group/Waikato/FSEN/School of Engineering/2018 PBRF - School of Engineering
pubs.publisher-urlhttps://www.ncbi.nlm.nih.gov/pubmed/30273153en_NZ
pubs.user.infoScott, Jonathan (scottj@waikato.ac.nz)
pubs.volume26en_NZ
uow.verification.statusverified
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